Advancing Memristive Analog Neuromorphic Networks: Increasing Complexity, and Coping with Imperfect Hardware Components
Bayat, Prezioso, Chakrabarti, Kataeva, Strukov · cs.ET,cs.NE · 2016-11-10 · 原文
We experimentally demonstrate classification of 4x4 binary images into 4 classes, using a 3-layer mixed-signal neuromorphic network ("MLP perceptron"), based on two passive 20x20 memristive crossbar arrays, board-integrated with discrete CMOS components. The network features 10 hidden-layer and 4 output-layer analog CMOS neurons and 428 metal-oxide memristors, i.e. is almost an order of magnitude more complex than any previously reported functional memristor circuit. Moreover, the inference operation of this classifier is performed entirely in the integrated hardware. To deal with larger crossbar arrays, we have developed a semi-automatic approach to their forming and testing, and compared several memristor training schemes for coping with imperfect behavior of these devices, as well as with variability of analog CMOS neurons. The effectiveness of the proposed schemes for defect and variation tolerance was verified experimentally using the implemented network and, additionally, by modeling the operation of a larger network, with 300 hidden-layer neurons, on the MNIST benchmark. Finally, we propose a simple modification of the implemented memristor-based vector-by-matrix multiplier
讲义
讲义·推断 依据「原文」自动生成的结构化摘要（推断），非原文表述；以原文为准。
1. 人话版
We experimentally demonstrate classification of 4x4 binary images into 4 classes, using a 3-layer mixed-signal neuromorphic network ("MLP perceptron"), based on two passive 20x20 memristive crossbar arrays, board-integrated with discrete CMOS components.
The network features 10 hidden-layer and 4 output-layer analog CMOS neurons and 428 metal-oxide memristors, i.e.
2. 领域脉络
本文类目：cs.ET、cs.NE，属于其所在研究脉络的最新进展。
3. 机制拆解
is almost an order of magnitude more complex than any previously reported functional memristor circuit.
Moreover, the inference operation of this classifier is performed entirely in the integrated hardware.
To deal with larger crossbar arrays, we have developed a semi-automatic approach to their forming and testing, and compared several memristor training schemes for coping with imperfect behavior of these devices, as well as with variability of analog CMOS neurons.
4. 证据与数字
The effectiveness of the proposed schemes for defect and variation tolerance was verified experimentally using the implemented network and, additionally, by modeling the operation of a larger network, with 300 hidden-layer neurons, on the MNIST benchmark.
5. 反例与边界
摘要未声明局限与反例——这是需要警惕的信号，精读时先问边界。
6. 跨领域连接与意外收获
横跨 2 个类目（cs.ET、cs.NE），关注其在你兴趣板块间的迁移面。
7. 可复用方法
把本文机制与你手头项目对照，找一个两周内能验证的最小实验。
8. 术语表
精读时把不熟的术语记入此处，作为下次回忆的锚点。